- PLLs and frequency modulation measure jitter, time interval error and settling time
- Ultrasonic and radar pulse timing
- Optical and magnetic disk drive measure jitter and bit timing directly
- PCI Express and other high speed serial interfaces measure jitter and skew
- Oscillators and crystals measure start-up time and Time Interval Error
- Pulse width modulated signals measure variations over time
- Nuclear physics
- Time stamping of events in real time
 |
Application Note: Clock Chip and Oscillator Testing |
|
Application Note: Upgrade Your Tester |
|
Application Note: Loadboard Design, TIA and Tester Pins |
|
Application Note: Frequency Reference Comparison |
NI Week 2014:
IDT Uses Carmel Products in National Instruments' Tester
Since 2012, Carmel Instruments has worked closely with National Instruments to support precision time and frequency measurement applications on NI’s new semiconductor tester. National Instruments introduced this PXI-based tester at NI Week 2014.
